Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis (Hardcover)

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Description


The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Product Details
ISBN: 9781848167896
ISBN-10: 184816789X
Publisher: Imperial College Press
Publication Date: June 6th, 2014
Pages: 616
Language: English